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Nanoscale CMOS VLSI circuits : design for manufacturability / Sandip Kundu, Aswin Sreedhar.
Publication details: New York : McGraw-Hill, c2010.Description: xv, 296 p. : ill. ; 24 cmISBN:- 9780071635196 :
- 007163519X :
- Nanoscale complementary metal oxide semiconductor very large-scale integration circuits [Cover title]
- TK7871.99.M44 K84 2010
Contents:
Semiconductor manufacturing -- Process and device variability : analysis and modeling -- Manufacturing-aware physical design closure -- Metrology, manufacturing defects, and defect extraction -- Defect impact modeling and yield improvement techniques -- Physical design and reliability -- Design for manufacturability : tools and methodologies.
| Item type | Current library | Home library | Shelving location | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|
Books
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American University in Dubai | American University in Dubai | Main Collection | TK 7871.99 .M44 K84 2010 (Browse shelf(Opens below)) | Available | 5027357 |
Browsing American University in Dubai shelves, Shelving location: Main Collection Close shelf browser (Hides shelf browser)
| TK 7871.85 .S522 2005 Power electronic modules : design and manufacture / | TK 7871.85 .S9883 2002 Semiconductor devices, physics and technology / | TK 7871.99 .M44 G35 2007 MOFSET modeling for circuit analysis and design / | TK 7871.99 .M44 K84 2010 Nanoscale CMOS VLSI circuits : design for manufacturability / | TK 7871.99 .M44 S49 2004 CMOS electronics : how it works, how it fails / | TK 7872 .D48 E94 2010 Wireless Sensor Networks : 7th European Conference, EWSN 2010, Coimbra, Portugal, February 17-19, 2010 : Proceedings / | TK 7872 .D48 S45 2005 Sensor technology handbook / |
Includes bibliographical references and index.
Semiconductor manufacturing -- Process and device variability : analysis and modeling -- Manufacturing-aware physical design closure -- Metrology, manufacturing defects, and defect extraction -- Defect impact modeling and yield improvement techniques -- Physical design and reliability -- Design for manufacturability : tools and methodologies.
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